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Parametric Test and Characterization Engineer
| Location: | Bangalore, Bangalore, Karnataka, India |
|---|---|
| Job Type: | Permanent |
| Posted: | 3rd Sep 2009 |
| Closing Date: | 1st Oct 2009 |
| Posted By: | iNetframe |
| Details: | |
| Parametric Test and Characterization Engineer We are looking for a Parametric Test and Characterization Engineer to work in the area of advanced semiconductor devices and memory technologies. This position is in the R&D Device Analysis group working closely with R&D and Manufacturing groups. This position will support worldwide efforts in the area of device characterization, parametric program development, support for Keithley and Agilent platforms, and production Fab sustainment. Strong programming experience in C/C++ and scripting languages such as Perl is essential. Exposure to programming environments for developing control software to interface electrical characterization equipment (such as Labview) would be a plus. Candidate should be familiar with Unix/Linux operating systems. A good understanding of state-of-the art CMOS process technology, deep submicron device characterization, statistical techniques for analyzing parametric & reliability data would be a plus. Experience in using semiconductor parametric analyzers, CV meters, high frequency characterization techniques using network analyzers, noise measurements, and other DC and AC characterization techniques is desired. Candidates should have an Master's in one of the following areas - EE, CS. Candidates with a Bachelor's degree can apply if they have a strong background in semiconductor devices through graduate-level classes in related areas and have >5 years of experience in the semiconductor industry and in automated test environments. | |
| Sorry! This job is no longer active as the closing date for applications has passed. You can view other vacancies from this company (if they have any) by clicking on their name above, alternatively we may have some suggestions for similar vacancies listed below that might be of interest. | |
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